SEMICON KOREA 2025

Nidec Advance Technology Corporation (“Nidec Advance Technology” or the “Company”) today announced that it will exhibit products at SEMICON KOREA 2025, an event to be held at COEX Convention Center in the city of Seoul from Wednesday, February 19 – Friday, February 21, 2025.

This upcoming exhibition will see Nidec Advance Technology showcase its state-of-the-art solutions, including: power semiconductor inspection equipment for IGBT/SiC, and test benches for driving motors of EVs, HEVs, and other vehicles; and a probe card, a wafer inspection tool developed and manufactured by Nidec SV Probe Corporation, a subsidiary of the Company.
Also to be displayed at the event are Nidec Advance Technology’s semiconductor probe card, semiconductor package substrate electrical inspection system (GATS series), and power semiconductor electrical inspection system (NATS series), all of which embody the Company’s core technology of “measuring.”

Based on the inspection technologies it has nurtured so far, Nidec Advance Technology will propose its cutting-edge solutions, and new products and technologies that contribute to the future.