Nidec Advance Technology Corporation
Business Summary
The features of our main product line.
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Credibility built on market-proven technology.
Technology developed in order to meet market needs has been contributing in the production lines around the world.
Born out of the need for high-speed, high-accuracy measurement/ inspection of fast-evolving electronic components, NIDEC ADVANCE TECHNOLOGY products reflect the culmination of our longstanding experiences in a variety of elemental technologies. Our technical portfolio today realizes extensive application in:
- mission-critical, high-performance integrated circuits and associated software
- hardware design enabling submicron control
- component fixture operation for processing and assembling multi-pin and narrow-pitch chips, and
- two- and three-dimensional optical imaging and three-dimensional process technology
NIDEC ADVANCE TECHNOLOGY’s main strength derives from the ability to blend a wide range of elemental technologies to the industry's highest level of performance.
Automatic Test Equipment
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NIDEC ADVANCE TECHNOLOGY GATS (Grid Array Testing System) series carry out open/leak circuit tests on semiconductor package (MCM/CSP/BGA). NIDEC ADVANCE TECHNOLOGY offers an array of testing equipment used to conduct open/leak tests on motherboards, as well as many other printed circuit boards. NIDEC ADVANCE TECHNOLOGY provides open/leak inspection system for touch screen panel and LCD, at singulated size to multifaced size, making use of our diversed contact & non-contact technologies.
Electrical Tester
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NIDEC ADVANCE TECHNOLOGY testers undertake various types of continuity tests at broad voltage and resistance levels.
Fixture and Software for Open/Leak Inspection
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In addition to jigs and fixtures for probing conductors and electrode pads, NIDEC ADVANCE TECHNOLOGY provides specialized software for test point selection and log analysis.
Automated Optical Inspection Equipment
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NIDEC ADVANCE TECHNOLOGY's inspection systems serve to locate open/leak circuits on printed substrates forming different conductor patterns within photomasks and inner/outer layers. These vision inspection systems are also used to measure the shape of via holes and solder bumps and to find scratches and stains on them.
Probe Card
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Our probe cards are a perfect solution for advanced wafer testing challenges.